Wafer Defect Detection Algorithm Incorporating Inverted Residuals and Expansion Reparameterization
WANG Quan, WANG Mengnan, SUN Jiadong, CHEN Deji, XIAO Shang
Computer Engineering and Applications . 2025, (19): 190 -201 .  DOI: 10.3778/j.issn.1002-8331.2412-0032

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