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中文
Test pattern generation for crosstalk-induced delay faults based on MAF model
YAN Xue-long
1
,LIANG Xiao-lin
1
,SHANG Yu-ling
1,2
Computer Engineering and Applications . 2009, (
19
): 62 -65 . DOI: 10.3778/j.issn.1002-8331.2009.19.018
