Test pattern generation for crosstalk-induced delay faults based on MAF model
YAN Xue-long1,LIANG Xiao-lin1,SHANG Yu-ling1,2
1.School of Electronic Engineering,Guilin University of Electronic Technology,Guilin,Guangxi 541004,China 2.CAD Institute,Xi’an University of Electronic Technology,Xi’an 710071,China
YAN Xue-long1,LIANG Xiao-lin1,SHANG Yu-ling1,2. Test pattern generation for crosstalk-induced delay faults based on MAF model[J]. Computer Engineering and Applications, 2009, 45(19): 62-65.