Computer Engineering and Applications ›› 2009, Vol. 45 ›› Issue (19): 62-65.DOI: 10.3778/j.issn.1002-8331.2009.19.018

• 研发、设计、测试 • Previous Articles     Next Articles

Test pattern generation for crosstalk-induced delay faults based on MAF model

YAN Xue-long1,LIANG Xiao-lin1,SHANG Yu-ling1,2   

  1. 1.School of Electronic Engineering,Guilin University of Electronic Technology,Guilin,Guangxi 541004,China
    2.CAD Institute,Xi’an University of Electronic Technology,Xi’an 710071,China
  • Received:2008-05-21 Revised:2008-10-07 Online:2009-07-01 Published:2009-07-01
  • Contact: YAN Xue-long

基于MAF模型的串扰时延故障的测试矢量生成

颜学龙1,梁晓琳1,尚玉玲1,2   

  1. 1.桂林电子科技大学 电子工程学院,广西 桂林 541004
    2.西安电子科技大学 电路CAD研究所,西安 710071
  • 通讯作者: 颜学龙

Abstract: With deep submicron technology,crosstalk noise becomes more and more serious.This paper uses the theory of Maximal Aggressor Fault model(MAF),and discusses a crosstalk delay maximization algorithm,and generates test vectors by using revised FAN algorithm.For a sensitization path,the corresponding aggressors and victim are activated appropriately by using revised FAN algorithm,so that the circuit in the worst case has induced the greatest path delay,and more effective delay test is achieved.By assessing on ISCAS’85 benchmark circuits,experimental results show that the algorithm is effective for crosstalk-induced delay faults by multiple aggressors.

Key words: delay fault, multiple aggressors, Maximal Aggressor Fault(MAF) model, test pattern generation, FAN algorithm

摘要: 随着深亚微米技术,串扰噪声问题越来越严重。利用MAF模型的基本思想,探讨了一种串扰时延最大化算法,并且利用被修改的FAN算法,生成测试矢量。对于一条敏化通路,利用被修改的FAN算法适当地激活相应的攻击线和受害线,使电路在最恶劣情况下引起最大通路时延,从而实现更有效的时延测试。在标准电路ISCAS’85上进行实验验证,结果表明:该算法对于多攻击线的串扰时延故障的测试矢量产生是有效的。

关键词: 时延故障, 多攻击线, 最大攻击线故障模型, 测试矢量生成, FAN算法