Research on processor circuit testing method of isolation

Computer Engineering and Applications ›› 2011, Vol. 47 ›› Issue (32): 78-81.

• 研发、设计、测试 • Previous Articles Next Articles

Research on processor circuit testing method of isolation

LU Feng1，2，FENG Fuzhou1，YAN Cunjin2

1.Department of Mechanical Engineering，Academy of Armored Force Engineering，Beijing 100072，China
2.Armored Force Equipment Technology Institute，Academy of Armored Force Engineering，Beijing 100072，China

Received:1900-01-01 Revised:1900-01-01 Online:2011-11-11 Published:2011-11-11

处理器电路的隔离测试方法研究

路锋1，2，冯辅周1，闫存金2

1.装甲兵工程学院机械工程系，北京 100072
2.装甲兵工程学院装甲兵装备技术研究所，北京 100072

Abstract

Abstract: Processor circuit testing and malfunction diagnosis is one of the difficulties in the field of automatic test and malfunction diagnosis.In the study，it proposes and designs a method of isolating test.In this method，it analyzes the basic circuit properties of the processor and uses the reset pin of the CPU to operate the CPU in a particular state，and then designs its peripheral circuit to transceiver data，makes the CPU "isolation" out of the circuit for testing.This method has its unique advantages.

Key words: automatic test, malfunction diagnosis, isolation test, complex circuit

摘要： 含处理器（CPU）电路的测试和故障诊断一直是测试领域的一个难点。在研究过程中，提出并设计了一种电气隔离测试方法。该方法通过对CPU电路基本属性分析，采用对CPU复位脚进行操作使其一直处于某种特定状态，并设计一套外围电路对其进行数据收发，从而实现将CPU从电路中“隔离”出来进行测试。实验结果表明，该方法具有其独特的优势。

关键词: 自动测试, 故障诊断, 隔离测试, 复杂电路

LU Feng1，2，FENG Fuzhou1，YAN Cunjin2. Research on processor circuit testing method of isolation[J]. Computer Engineering and Applications, 2011, 47(32): 78-81.

路锋1，2，冯辅周1，闫存金2. 处理器电路的隔离测试方法研究[J]. 计算机工程与应用, 2011, 47(32): 78-81.

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Research on processor circuit testing method of isolation

处理器电路的隔离测试方法研究

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