Research on processor circuit testing method of isolation
LU Feng1,2,FENG Fuzhou1,YAN Cunjin2
1.Department of Mechanical Engineering,Academy of Armored Force Engineering,Beijing 100072,China 2.Armored Force Equipment Technology Institute,Academy of Armored Force Engineering,Beijing 100072,China
LU Feng1,2,FENG Fuzhou1,YAN Cunjin2. Research on processor circuit testing method of isolation[J]. Computer Engineering and Applications, 2011, 47(32): 78-81.