Fault diagnosis of analog circuits based on jointly selection of features and classifier parameters model
ZHANG Hao1, WANG Nan2, YE Mingquan1, XIE Fei3
1.Department of Computer, Wannan Medical College, Wuhu, Anhui 241002, China
2.Department of Electronic Information, Anqing Vocational and Technical College, Anqing, Anhui 246003, China
3.Department of Computer Science and Technology, Hefei Normal University, Hefei 230601, China
ZHANG Hao1, WANG Nan2, YE Mingquan1, XIE Fei3. Fault diagnosis of analog circuits based on jointly selection of features and classifier parameters model[J]. Computer Engineering and Applications, 2014, 50(1): 251-254.