Abstract: By studying the test set, it observes that the frequency of the count of the data blocks, which are compatible with the reference data block, is the highest at low values and decreased with increasing values. Based on the characteristic, this paper proposes a test data compression scheme, which exploits FDR variant to code the count of the compatible data blocks. Due to its simple architecture, the additional hardware overhead that the decompression circuit required is very small. Experimental results for the ISCAS’89 benchmark circuits show that this technique can efficiently compress test data.

Key words: compatible data block, test data compression, frequency-directed run-length code, decompression

摘要： 通过对测试集的研究发现，与参考数据块相容的数据块数目随着值的增加，其出现的频率急剧下降。基于这个特征，提出了一种利用FDR码变体来编码相容数据块数目的测试数据压缩方案。通过分析可知方案的解压电路结构简单，所需的硬件开销很小，对ISCAS’89基准电路的实验结果表明，该编码方法能有效地压缩测试数据。

关键词: 相容数据块, 测试数据压缩, FDR码, 解压