Fabric defect classification based on local binary patterns and Tamura texture feature method
JING Junfeng1,2, ZHANG Huanhuan1, LI Pengfei1, WANG Jing1
1.School of Electronic and Information, Xi’an Polytechnic University, Xi’an 710048, China
2.School of Electronical & Machanical Engineering, Xidian University, Xi’an 710071, China
JING Junfeng1,2, ZHANG Huanhuan1, LI Pengfei1, WANG Jing1. Fabric defect classification based on local binary patterns and Tamura texture feature method[J]. Computer Engineering and Applications, 2012, 48(23): 155-160.