Computer Engineering and Applications ›› 2007, Vol. 43 ›› Issue (7): 211-214.

• 工程与应用 • Previous Articles     Next Articles

The scheme for fabric defect detection based on Gabor filers

  

  • Received:2006-09-07 Revised:1900-01-01 Online:2007-03-01 Published:2007-03-01

基于Gabor滤波器组的织物疵点检测方法

韩润萍 孙苏榕 姜玲   

  1. 北京服装学院工业设计与信息工程学院
  • 通讯作者: 韩润萍

Abstract: A scheme for fabric defect detection based on Gabor filers is proposed in this paper. Based on the features of Gabor filers and textured materials with single color, a bank of ellipse-shaped Gabor filers with multi-scale and multi-orientation are designed. The fabric defect image is processed using this filter bank, and filtered sub-images are obtained which characterize the fabric defect in different orientations and scales in the frequency domain. These sub-images are fused in order to reconstruct the defect binary image that segments the defect from the texture background. Experiment results have confirmed the usefulness of this scheme for fabric defect detection.

摘要: 本文给出了基于Gabor滤波器组的织物疵点检测方法。在分析Gabor滤波器时频特性的基础上,针对素色坯布织物疵点图像,设计了椭圆型多尺度多方向的Gabor滤波器组,并应用该滤波器组在频域对织物疵点图像进行滤波处理,对滤波后的多幅图像进行融合与分割处理,将疵点从织物背景中分割出来,从而实现了疵点的检测。实验结果证明了这种方法的有效性。