Computer Engineering and Applications ›› 2006, Vol. 42 ›› Issue (23): 1-.

• 博士论坛 •     Next Articles

Design of a Reconfigurable Test Controller for Embedded Memory


  1. 西北工业大学航空微电子中心
  • Received:2006-05-17 Revised:1900-01-01 Online:2006-08-11 Published:2006-08-11



  1. 西北工业大学航空微电子中心
  • 通讯作者: 王党辉

Abstract: Based on the analysis of the various widely used March-Algorithm, a configurable March-Algorithm generator is proposed to realize all March-Algorithm by setting several control registers. Furthermore, a FSM (Finite State Machine), several control registers, and some new instructions, which are only used to test embedded memories, are added to the programmable core. A resource sharing architecture is also proposed in this paper. It is shown in this paper that the design is easily programmable with a few external controls. Also when combined with the existing functional units in the programmable core, the hardware overhead is quite small.

Key words: Memory, Test, Reconfigurable, March-Algorithm

摘要: 存储器在SOC中所占的电路面积越来越大,因此存储器的正确与否影响着SOC芯片的成品率。存储器中的故障种类繁多,单一的测试方法不能保证所有故障的100%覆盖率。本文通过对广泛应用的March算法进行了分析,提出了一种可重配置的存储器测试方法。在该方法中通过设置一组控制寄存器就可以灵活的实现各种March算法。另外,采用资源复用的方法,在嵌入式微处理器核中增加了一个有限状态机,几个控制寄存器和几条专门用于存储器测试的指令,可以方便的实现各种March算法,并且硬件开销非常小。

关键词: 存储器, 测试, 可重配置, March算法