Research on improved Markov process reliability model for high-performance disk array

doi:10.3778/j.issn.1002-8331.2010.36.026

Computer Engineering and Applications ›› 2010, Vol. 46 ›› Issue (36): 95-97.DOI: 10.3778/j.issn.1002-8331.2010.36.026

• 海量存储技术专题 • Previous Articles Next Articles

Research on improved Markov process reliability model for high-performance disk array

WANG Xiao-jun¹，PAN Qing²，ZHUANG Ze-nan¹，ZHANG Xiao-qing²

1.Graduate School，Academy of Equipment Command and Technology，Beijing 101416，China
2.Department of Information Equipment，Academy of Equipment Command and Technology，Beijing 101416，China

Received:2010-10-15 Revised:2010-11-18 Online:2010-12-21 Published:2010-12-21
Contact: WANG Xiao-jun

高端磁盘阵列马尔科夫过程可靠性模型研究

王霄军¹，潘清²，庄泽南¹，张晓清²

1.装备指挥技术学院研究生院，北京 101416
2.装备指挥技术学院信息装备系，北京 101416

通讯作者: 王霄军

Abstract

Abstract: This paper analyzes the shortcomings of typical model of disk arrays based on Markov model.According to the characteristics of disk arrays in mass storage system，combined with the Monte Carlo method，this paper introduces new state and parameters，improves the reliability of disk arrays based on Markov process model.

Key words: Markov process, Redundant Array of Independent Disk（RAID）, reliability

摘要： 介绍了基于马尔科夫过程的磁盘阵列典型模型，分析了典型模型中存在的不足。依照海量存储系统中磁盘阵列工作的特点，结合蒙特卡罗方法，引入新的状态和参数，对基于马尔科夫过程的磁盘阵列可靠性计算模型进行改进，使可靠性数值更接近实际情况。

关键词: 马尔科夫过程, 磁盘阵列, 可靠性

CLC Number:

TP302

WANG Xiao-jun¹，PAN Qing²，ZHUANG Ze-nan¹，ZHANG Xiao-qing². Research on improved Markov process reliability model for high-performance disk array[J]. Computer Engineering and Applications, 2010, 46(36): 95-97.

王霄军¹，潘清²，庄泽南¹，张晓清². 高端磁盘阵列马尔科夫过程可靠性模型研究[J]. 计算机工程与应用, 2010, 46(36): 95-97.

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Research on improved Markov process reliability model for high-performance disk array

高端磁盘阵列马尔科夫过程可靠性模型研究

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