Reduce sensitivity of wavelet denoising to outliers by arc-tangent function transformation
YANG Zhengling1,2, ZHANG Xi1, ZHANG Jun1,2, YANG Zhao1, LIU Yadi1
1.School of Electrical Engineering and Automation, Tianjin University, Tianjin 300072, China
2.Tianjin Key Laboratory of Process Measurement and Control, Tianjin 300072, China
YANG Zhengling1,2, ZHANG Xi1, ZHANG Jun1,2, YANG Zhao1, LIU Yadi1. Reduce sensitivity of wavelet denoising to outliers by arc-tangent function transformation[J]. Computer Engineering and Applications, 2017, 53(10): 241-245.