Survey of Fuzz Testing Embedded Device Firmwares
CHEN Jingjing, WANG Zhengwu, LAN Wenwei, ZHANG Ruichen, ZHANG Yadong, CUI Zhanqi
Computer Engineering and Applications . 2025, (23): 72 -89 .  DOI: 10.3778/j.issn.1002-8331.2503-0296

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