×
模态框（Modal）标题
在这里添加一些文本
Close
Close
Submit
Cancel
Confirm
×
模态框（Modal）标题
在这里添加一些文本
Close
×
Toggle navigation
Home
About Journal
Journal Introduction
Indexed In
Editorial Board
Journal Online
Current Issue
Archive
Most Read Articles
Most Download Articles
Most Cited Articles
Authors
Instruction
Peer Review
Download
CLC Number
Academic Integrity
Publishing Ethics
Academic Misconduct
Subscription
Contacts Us
中文
Sub-pixel measurement method for narrow cracks in industrial CT image
ZENG Li
1，3
，AN Bei-bei
1，2
，YUE Xiu-juan
1，3
Computer Engineering and Applications . 2010, (
30
): 230 -232 . DOI: 10.3778/j.issn.1002-8331.2010.30.065
