Computer Engineering and Applications ›› 2008, Vol. 44 ›› Issue (30): 87-89.DOI: 10.3778/j.issn.1002-8331.2008.30.026
• 研发、设计、测试 • Previous Articles Next Articles
LIU Wei,LEI Jia
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刘 伟,雷 加
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Abstract: Using pseudo-random sequence for testing stimulus，K-dimensional feature space can be obtained by calculating the cross-correlation function of input and output sequence.The Circuit Under Test（CUT） on the basis of feature space can be analyzed and estimated.It is proved that the method is simple and feasible，and it can increase the efficiency and accuracy of test.This method can be applied in the mixed-signal circuits test and in the Built-In Self-Test（BIST）.
Key words: pseudorandom testing, cross-correlation function, mixed-signal circuits, Built-In Self-Test（BIST）
摘要： 利用伪随机序列作为测试激励，通过计算输入输出的互相关函数得到K维特征空间，在特征空间的基础上进行分析，判别电路有无故障，实验证明该方法简单可行，且提高了测试的效率和正确性，适用于模拟及混合信号测试，适用于混合信号电路的内建自测试（BIST）。
关键词: 伪随机测试, 互相关函数, 混合信号电路, 内建自测试
LIU Wei,LEI Jia. Study of analog and mixed-signal circuit BIST based on pesudorandom testing[J]. Computer Engineering and Applications, 2008, 44(30): 87-89.
刘 伟,雷 加. 基于伪随机测试的模数混合信号内建自测试法[J]. 计算机工程与应用, 2008, 44(30): 87-89.
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URL: http://cea.ceaj.org/EN/10.3778/j.issn.1002-8331.2008.30.026
http://cea.ceaj.org/EN/Y2008/V44/I30/87
