Research on modeling of high-performance disk array reliability test

doi:10.3778/j.issn.1002-8331.2010.36.022

Computer Engineering and Applications ›› 2010, Vol. 46 ›› Issue (36): 82-84.DOI: 10.3778/j.issn.1002-8331.2010.36.022

• 海量存储技术专题 • Previous Articles Next Articles

Research on modeling of high-performance disk array reliability test

PAN Qing¹，ZHUANG Ze-nan²，ZHANG Xiao-qing¹，WANG Xiao-jun²

1.Department of Information Equipment，Academy of Equipment Command and Technology，Beijing 101416，China
2.Graduate School，Academy of Equipment Command and Technology，Beijing 101416，China

Received:2010-10-15 Revised:2010-11-17 Online:2010-12-21 Published:2010-12-21
Contact: PAN Qing

高端磁盘阵列可靠性测试建模方法研究

潘清¹，庄泽南²，张晓清¹，王霄军²

1.装备指挥技术学院信息装备系，北京 101416
2.装备指挥技术学院研究生院，北京 101416

通讯作者: 潘清

Abstract

Abstract: This paper introduces an important indicator of the reliability of high-reliability disk arrays—MTTDL，calculates MTTDL of the disk array constructed by various RAID levels by analyzing two reasons of the disk failure，designs BER（disk read error rate） testing scheme，and implements disk read error rate testing program based on distribution.

Key words: reliability test, Mean Time To Data Loss（MTTDL）, Bit Error Rate（BER）

摘要： 阐述了衡量高端磁盘阵列可靠性的重要指标MTTDL，通过分析两种造成磁盘错误的原因，建模计算了各种RAID级别的MTTDL，设计了磁盘读出错率的测试方案，实现了基于分布式的磁盘读出错率测试程序。

关键词: 可靠性测试, 平均无数据丢失时间（MTTDL）, 磁盘读出错率

CLC Number:

TP302

PAN Qing¹，ZHUANG Ze-nan²，ZHANG Xiao-qing¹，WANG Xiao-jun². Research on modeling of high-performance disk array reliability test[J]. Computer Engineering and Applications, 2010, 46(36): 82-84.

潘清¹，庄泽南²，张晓清¹，王霄军². 高端磁盘阵列可靠性测试建模方法研究[J]. 计算机工程与应用, 2010, 46(36): 82-84.

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Research on modeling of high-performance disk array reliability test

高端磁盘阵列可靠性测试建模方法研究

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