Computer Engineering and Applications ›› 2012, Vol. 48 ›› Issue (6): 166-168.

• 图形、图像、模式识别 • Previous Articles     Next Articles

Defect fabric determining based on wavelet subgraph mapping

MA Xinyu1, LIN Yi2   

  1. 1.School of IoT Engineering, Jiangnan University, Wuxi, Jiangsu 214122, China
    2.School of Digital Media, Jiangnan University, Wuxi, Jiangsu 214122, China
  • Received:1900-01-01 Revised:1900-01-01 Online:2012-02-21 Published:2012-02-21

基于小波子图映射的疵点织物判定方法

马鑫宇1,林 意2   

  1. 1.江南大学 物联网工程学院,江苏 无锡 214122
    2.江南大学 数字与媒体学院,江苏 无锡 214122

Abstract: To improve the efficiency and accuracy of automatic fabric defect detection, a method of fabric defects determining based on wavelet subgraph mapping has been proposed, and the process of operation and related theory which the wavelet subgraph mapping, the subgraph energy statistics, analysis of subgraph energy, the final determination is deeply illustrated. Accoding to the experimental results and comparison with related metods, the proposed method is with high accuracy, reliability, low computing cost, small implementation cost, and has a practical significance.

摘要: 为了提高织物自动化疵点检测的效率和准确性,提出了一种基于小波子图映射的疵点织物判定方法,并详细阐述了小波子图映射、子图能量统计、子图能量分析,最终判定这一系列操作过程及相关的理论分析。通过实验以及与相关方法的比较,说明该方法的准确性高,可靠性强,计算量低,实现成本小,具有实践意义。