关键词: 现场可编程门阵列（FPGA）, 空间辐射, 单粒子效应, SelectMAP, 回读, 静态随机存储器（SRAM）

Abstract: The space application of FPGA（Field Programmable Gate Array） is restricted by the single event effects caused by radiation. In order to improve the reliability of the FPGA in the?radiation environment?, the method of single event effect assessment for hardened FPGA is studied. The single event effect assessment program is optimized and two methods are introduced, one is SRAM clock-correcting based bitstream storage comparison method and the other is configuration readback method based on SelectMAP port. Some experiments about Single Event Upset（SEU）, Single Event Latch（SEL） and Single Event Function Interrupt（SEFI） are done with the help of high-energy radiation experiment environment. The results show that the assessment program introduced is scientific and effective for SRAM based FPGA radiation assessment.

Key words: Field Programmable Gate Array（FPGA）, space radiation, single event effects, SelectMAP, readback, Static Random Access Memory（SRAM）