计算机工程与应用 ›› 2008, Vol. 44 ›› Issue (34): 77-79.DOI: 10.3778/j.issn.1002-8331.2008.34.023

• 研发、设计、测试 • 上一篇    下一篇

基于分级归一化兼容性的COS通用测试平台研究

边红丽,罗洪元   

  1. 国家电子标签产品质量监督检验中心,北京 100083
    国家电子计算机质量监督检验中心,北京 100083
  • 收稿日期:2008-06-17 修回日期:2008-07-08 出版日期:2008-12-01 发布日期:2008-12-01
  • 通讯作者: 边红丽

Research on IC card operating system general test platform based on grading for unitary compatibility method

BIAN Hong-li,LUO Hong-yuan   

  1. National RFID Product Quality Supervising Test Center,Beijing 100083,China
    National Computer Quality Supervising Test Center,Beijing 100083,China
  • Received:2008-06-17 Revised:2008-07-08 Online:2008-12-01 Published:2008-12-01
  • Contact: BIAN Hong-li

摘要: 针对目前多功能卡的需求以及单应用COS测试平台的评测效率低、安全性差、跟踪响应慢等问题,进行了通用测试平台建设的研究,提出了分级归一化兼容性设计思想,并实现了对多功能COS的快速兼容、科学、高效的测试平台,取得了明显的社会和经济效益。

关键词: 卡操作系统, 多功能卡, 测试, 硬件, 软件

Abstract: The paper presents a grading for unitary compatibility design method to resolve the limited of the special COS test platform such as low rate responding to compatibility and low efficiency on function and safety evaluation.

Key words: Card Operating System(COS), multi-function card, test, hardware, software