关键词: 脑功能网络, 负连接, 重测信度

Abstract:

To accurately characterize and evaluate the topology of brain functional networks, how to define the nodes and edges of network is critical. Brain functional networks are constructed based on four strategies for defining nodes and two processing methods for negative connections and applied to test-retest reliability analysis of different time intervals. The comparison between absolute and positive networks aims to find out the influence of different processing methods for negative connections on the reliability of brain functional networks. The results show that absolute networks containing negative connections information exhibit relatively low long-term reliability and are limited by strategies for defining nodes. The difference of test-retest reliability among different processing methods for negative connections provides methodological suggestions for the study of brain functional networks.

Key words: brain functional networks, negative connections, test-retest reliability