关键词: SRAM型现场可编程门阵列, 单粒子翻转, 通用布局布线算法, 布线

Abstract: With higher density and lower operating voltage，SRAM-based Field Programmable Gate Arrays（FPGAs） are more sensitive to Single Event Upset（SEU）.A VPR-based anti-SEU algorithm is presented，by modifying relative routing resources’ cost function to minimize bridging errors caused by SEU.The experimental results show that this method can improve FPGA chip’s soft-error tolerance performance by 20% compared with VPR，without introducing extra hardware resources and additional design redundancy.

Key words: SRAM-based Field Programmable Gate Arrays（FPGA）, Single Event Upset（SEU）, Versatile Placement and Routing（VPR）, routing