关键词: 局部二值模式（LBP）, 窗阈值中心对称LBP（WTCSLBP）, 作物病害叶片, 叶片病斑检测

Abstract: It is the basis for the prevention and control of the crop diseases to detect accurately and rapidly the crop diseases according to the crop leaf symptoms. For accurate detection of the crop leaf diseases, a crop spot detection method is proposed based on Window Threshold Center-Symmetric Local Binary Pattern（WTCSLBP）. Firstly, the disease leaf features are obtained and the threshold to judge the spot is estimated by Adaptive Local Binary Pattern（ALBP）. Then the leaf image to be tested is divided into the same size detection window from which the ALBP features are also extracted. The ALBP features are compared to the threshold to find the disease spot. The experimental results on the database of three apple disease images show that the proposed method can effectively detect the crop disease spot distribution characteristics. Compared with Center-Symmetric Local Binary Pattern（CS-LBP） and WTCSLBP, this proposed method has the less number of dimension characteristics and higher correct recognition rate.

Key words: Local Binary Patterns（LBP）, Window Threshold Center-Symmetric Local Binary Pattern（WTCSLBP）, crop disease leaf, leaf spot detection