关键词: 点阵比较, 点阵相似度比较, 图形轮廓比较, 点阵样本点匹配

Abstract: In some engineering practices, it is necessary to match a Spot Array [P*] which is most similar to an unknown Spot Array [P] from a set [S] that includes multiple similar known Spot Arrays and match pairs of samples between the two Spot Arrays. The key challenge to realize the task is how to match the known [P*] with the most similar to unknown [P.] This is a new novel challenge somewhat and it has been researching barely in theory. A described algorithm based on geometrical features analysis in graphics is explored in this paper. Among the algorithm, its first step is to construct each Spot Array into a Simple Graph as its outline graphic and constructs a chained construction for each at the same time, it is possible to get the pairs of samples matching finished between the two Spot Arrays by utilizing these chained constructions. In the end, the similarity between the unknown Spot Array and each known Spot Array can be calculated by using their geometrical features, then matching up one pair which most similar. It is not affected by the effects of both graphical rotation and size scaling. By several experiments show that this algorithm can fastly and precisely finish the task in comparing the graphical similarity and samples matching.

Key words: comparison in spot array, comparison in spot array similarity, comparison in graphical outline, matching spot array sample