关键词: Sn-Sb-Cu, 金相, 特征参数, 多边形包含, 紧凑度

Abstract:  In order to measure phase parameters of Sn-Sb-Cu micrographs fast and accurately, a metallographic recognition method based on gray and shape features is given. Determining the inclusion relationship of polygons by improving the test method of intersection-point count can greatly reduce the probability of graphics misrecognition. Compactness, an extracted feature, can describe difference of each phase better. Experimental results show that the proposed method has a high recognition rate for metallographic, the obtained relative amounts of each phase are close to measured data of XRD spectra, and using the extracted phase parameters can establish a quantitative relationship between the organization and hardness.

Key words:  Sn-Sb-Cu, phase, characteristic parameters, polygon inclusion, compactness