关键词: 相容数据块, 测试数据压缩, FDR码, 解压

Abstract: By studying the test set, it observes that the frequency of the count of the data blocks, which are compatible with the reference data block, is the highest at low values and decreased with increasing values. Based on the characteristic, this paper proposes a test data compression scheme, which exploits FDR variant to code the count of the compatible data blocks. Due to its simple architecture, the additional hardware overhead that the decompression circuit required is very small. Experimental results for the ISCAS’89 benchmark circuits show that this technique can efficiently compress test data.

Key words: compatible data block, test data compression, frequency-directed run-length code, decompression