基于多故障模型的并发测试生成方法

计算机工程与应用 ›› 2007, Vol. 43 ›› Issue (29): 113-115.

基于多故障模型的并发测试生成方法

欧阳一鸣,鲁传武,梁华国

合肥工业大学计算机与信息学院,合肥 230009

收稿日期:1900-01-01 修回日期:1900-01-01 出版日期:2007-10-11 发布日期:2007-10-11
通讯作者: 欧阳一鸣

Concurrent test generation method based on multiple faults model

OUYANG Yi-ming,LU Chuan-wu,LIANG Hua-guo

School of Computer and Information,Hefei University of Technology,Hefei 230009,China

Received:1900-01-01 Revised:1900-01-01 Online:2007-10-11 Published:2007-10-11
Contact: OUYANG Yi-ming

摘要/Abstract

摘要： 精简测试向量集是解决电路测试问题的一种行之有效的方法。针对故障电路,采用多故障模型方法可以简化有多个单故障的电路,且保持电路功能完整。论文在结构分析的基础上,利用多故障模型寻找故障集中的并发故障,建立并发关系图,并运用分团的思想对故障集中的并发故障进一步划分,以获得故障集的并发测试集。与传统的方法相比,并发测试生成将获得更加精简的测试向量集。

关键词: 故障压缩, 多故障模型, 并发测试集, 并发故障

Abstract: The method of refining test patterns is useful to resolve circuit test problems.Multiple fault collapsing methods can simplify circuits with multiple single faults and keep its function integrated.Based on structure analysis,this paper proposes a multiple fault model to find concurrent faults from fault sets and to generate concurrent relation graph.Concurrent faults are further divided into groups to obtain concurrent test sets.Compared to traditional methods,the generation of concurrent test sets greatly refines test pattern sets.

Key words: fault collapsing, multiple fault model, concurrent test set, concurrent fault

欧阳一鸣,鲁传武,梁华国. 基于多故障模型的并发测试生成方法[J]. 计算机工程与应用, 2007, 43(29): 113-115.

OUYANG Yi-ming,LU Chuan-wu,LIANG Hua-guo. Concurrent test generation method based on multiple faults model[J]. Computer Engineering and Applications, 2007, 43(29): 113-115.