Unsupervised Industrial Defect Detection Method Based on Diffusion Model and Knowledge Distillation
LIU Mingming, SHI Weifeng, FAN Xuehui, ZHANG Haiyan
Computer Engineering and Applications . 2025, (23): 205 -211 .  DOI: 10.3778/j.issn.1002-8331.2506-0028

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