%0 Journal Article
%A QIAO Xin-yong
%A ZHOU Yun-feng
%T Method for optimizing structure of neural network in states measuring based on multi-parameters
%D 2009
%R 10.3778/j.issn.1002-8331.2009.08.071
%J Computer Engineering and Applications
%P 236-237
%V 45
%N 8
%X It is an effective method to measure the states of a device using multi-parameters，but the calculations are considerable when the number of the measured parameters is large，so such a problem should not be neglected.This paper studies the structure optimization of artificial neural network when measuring the state of a device，puts forward a combined neural network model including the functions of compressing characteristic and diagnosing faults.The result after simulating shows that such kind of combined network reduces the calculations and also improves the performance of convergence.
%U http://cea.ceaj.org/EN/10.3778/j.issn.1002-8331.2009.08.071