Realizing circular subpixel edge detection based on improved Zernike method
ZHANG Xiaolin1, ZHOU Zhehai1,2, WANG Xiaoling1, ZHU Lianqing1,2
1.Beijing Key Laboratory of Optoelectronic Technology Testing, Beijing Information Science and Technology University, Beijing 100192, China
2.Optoelectronic Information and Instrumentation Engineering Technology Research Center in Beijing, Beijing Information Science and Technology University, Beijing 100192, China
ZHU Mingming1, XU Yuelei1, ZHANG Xulei2, MA Shiping1, LV Chao1, XIN Peng1, ZOU Hongzhong1, MA Hongqiang1.
Edge detection based on characteristic of V1 cells
[J]. Computer Engineering and Applications, 2018, 54(5): 200-205.