Computer Engineering and Applications ›› 2015, Vol. 51 ›› Issue (2): 64-68.
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HE Xiaoli, SHE Yanhong
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Published:
贺晓丽,折延宏
Abstract: In relevant literature a quantitative approach to the study of rough logic has been presented, resulting in a kind of rough logic metric space for the approximate reasoning in rough logic. In this paper, by employing the rough logic metric space theory, the consistency of logic theories is characterized from the viewpoint of topology.
Key words: rough logic metric space, consistency, topological characterization
摘要: 有关文献将计量化方法应用于粗糙逻辑之中,建立起了用以处理近似推理问题的粗糙逻辑度量空间理论。拟借助于粗糙逻辑度量空间理论,从拓扑学的角度给出粗糙逻辑理论相容性的等价刻画。
关键词: 粗糙逻辑度量空间, 相容性, 拓扑刻画
HE Xiaoli, SHE Yanhong. On topological characterization of consistency of logic theories in rough logic[J]. Computer Engineering and Applications, 2015, 51(2): 64-68.
贺晓丽,折延宏. 粗糙逻辑中理论相容性的拓扑刻画[J]. 计算机工程与应用, 2015, 51(2): 64-68.
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http://cea.ceaj.org/EN/Y2015/V51/I2/64