关键词: 嵌入式系统, 测试

Abstract: Abstract：Applications for constrained embedded systems require careful attention to the match between the application and the support offered by the architecture, at the ISA and microarchitecture levels. Moreover, while application-specific, customized logic could dramatically improve the performance of an application, that approach is typically too expensive to justify its cost for most applications. In this paper, we address our ideas using tunable architectures to develop an understanding of an application’s performance and to enhance its performance with respect to customized module. Especially, This paper addresses the challenges associated with the research issues about Embedded Intel Architecture (EIA), and further more, figures out a draft about how to make a unified approach to combine multiple EIA cores as a whole embedded computing solution to industry application. In this solution, coarse-grained parallelism mechanism is used instead of both dual cores and configurable architecture to achieve ILP in embedded system.

Key words: Embedded System, Test, Embedded Intel Architecture, Configurable Processor